学者信息
已发表成果：
WOK 论文 20 篇;其它论文 2 篇;
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Tailoring Fluorescence-Phosphorescence Emission with a Single Nanocavity
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY,0002-7863,2023-09-05.
Peng, Wei; Wang, Yao-Hui; He, Jiaxing; Yang, Jing-Liang; Wang, Jingyu; Radjenovic, Petar M.; Lin, J...
WOS:001062608900001 EI:20233814758654 10.1021/jacs.3c05496
收录情况：SCIE、EI -
Revealing the role of interfacial water and key intermediates at ruthenium surfaces in the alkaline hydrogen evolution reaction
NATURE COMMUNICATIONS,,2023-08-30.
Chen, Xing; Wang, Xiao-Ting; Le, Jia-Bo; Li, Shu-Min; Wang, Xue; Zhang, Yu-Jin; Radjenovic, Petar; ...
WOS:001058614600003 10.1038/s41467-023-41030-1
收录情况：SCIE -
Characterizing surface-confined interfacial water at graphene surface by<i> in</i><i> situ</i> Raman spectroscopy
Joule,2542-4351,2023-07-19.
Wang, Yao-Hui; Jin, Xin; Xue, Minmin; Cao, Mao-Feng; Xu, Fan; Lin, Gao-Xiang; Le, Jia-Bo; Yang, Wei...
WOS:001046617000001 EI:20232914416723 10.1016/j.joule.2023.06.008
收录情况：SCIE、EI -
Understanding the origin of the improved sodium ion storage performance of the transition metal oxide@carbon nanocomposite anodes
Journal of Chemical Physics,0021-9606,2023-05-07.
Yang, Xin-Tao; Huang, Ting-Yi; Wang, Yao-Hui; Dong, Jin-Chao; Wei, Qiu-Long; Zhang, Hua; Lin, Xiu-M...
WOS:001010643300006 EI:20231914077653 10.1063/5.0149871
收录情况：SCIE、EI -
<i>In situ</i> tracking of the lithiation and sodiation process of disodium terephthalate as anodes for rechargeable batteries by Raman spectroscopy
Nano Research,1998-0124,2023.
Lin, Xiu-Mei; Han, Chong; Yang, Xin-Tao; Lin, Jia-Sheng; Yang, Wei-Qiang; Guo, Hong-Xu; Wang, Yao-H...
WOS:000986492600004 EI:20232014087371 10.1007/s12274-023-5680-4
收录情况：SCIE、EI -
Direct S-H Evidence Revealing the Photo-electrocatalytic Hydrogen Evolution Reaction Mechanism on CdS Using Surface-Enhanced Raman Spectroscopy
Journal of Physical Chemistry Letters,1948-7185,2023.
Huang, Xiao-Xuan; Wang, Hong-Jia; Yang, Jing-Liang; Yue, Mu-Fei; Wang, Yao-Hui; Zhang, Hua; Li, Jia...
WOS:000980459200001 EI:20231914060836 10.1021/acs.jpclett.3c00701
收录情况：SCIE、EI