Degradation modeling and remaining useful lifetime prediction based on functional variance process
APPLIED STOCHASTIC MODELS IN BUSINESS AND INDUSTRY,1524-1904,2024-05-01.
Qin, Linjie; Shen, Yan
WOS:001216773700001
EI:20241916037683 10.1002/asmb.2866
收录情况:SCIE、EI